Probe station system. MSTECH Probe station(MST 4000A) for electrical property measurements Probe station system. hp 4155A Semiconductor parameter analyzer for measuring and analyzing the characteristics of semiconductor device.

프루브 스테이션, 반도체 특성 분석기

4 Probe holder(C15, Triaxial) with tungsten bending tips, Eyepiece ~20, Zoom : 0.7x ~ 4.5x

Four highly accurate source/monitor units, two voltage source units, two voltage measurements units